Ferroelectric-Gate Field Effect Transistor Memories
Ferroelectric-Gate Field Effect Transistor Memories
Device Physics and Applications
Okuyama, Masanori; Park, Byung-Eun; Ishiwara, Hiroshi; Sakai, Shigeki; Yoon, Sung-Min
Springer Verlag, Singapore
12/2019
Dura
Inglês
9789811512117