Science of Microscopy

Science of Microscopy

Hawkes, Peter; Spence, John C. H.

Springer-Verlag New York Inc.

11/2016

1322

Mole

Inglês

9781493938643

15 a 20 dias

This corrected second impression of the classic 2006 text on microscopy covers up-to-the-minute developments in the field. The work brings together experts who present reviews of the latest instruments and new versions of older ones, as well as their associated operational techniques.
Imaging With Electrons.- Atomic Resolution Transmission Electron Microscopy.- Scanning Transmission Electron Microscopy.- Scanning Electron Microscopy.- Analytical Electron Microscopy.- High-Speed Electron Microscopy.- In Situ Transmission Electron Microscopy.- Cryoelectron Tomography (CET).- LEEM and SPLEEM.- Photoemission Electron Microscopy (PEEM).- Aberration Correction.- Imaging With Photons.- Two-Photon Excitation Fluorescence Microscopy.- Nanoscale Resolution in Far-Field Fluorescence Microscopy.- Principles and Applications of Zone Plate X-Ray Microscopes.- Near-Field Scanning Probes.- Scanning Probe Microscopy in Materials Science.- Scanning Tunneling Microscopy in Surface Science.- Atomic Force Microscopy in the Life Sciences.- Low-Temperature Scanning Tunneling Microscopy.- Holographic And Lensless Modes.- Electron Holography.- Diffractive (Lensless) Imaging.- The Notion of Resolution.